Used NANOMETRICS 8300X #9219449 for sale

NANOMETRICS 8300X is a breakthrough mask & wafer inspection system developed by NANOMETRICS Incorporation. This state-of-the-art system is capable of inspecting a wide range of mask and wafer features with high accuracy. It offers the highest level of sensitivity, detail, and resolution for creative process and product development applications. 8300X is designed with a highly flexible architecture that can be adapted as the required needs of the inspection process change. Its modular scanner is configurable for various mask and wafer types, such as backside skin and sputtered wafers. NANOMETRICS 8300X features an advanced feature detection technology, which enables it to detect and isolate complex shapes and patterns easily. Using a combination of multi-spectral imaging techniques, including fluorescence, UV imaging, and standard imaging, 8300X is able to inspect a wide range of features. Its spectral imaging technology allows for way finding and feature detection, which is critical for successful design validation applications. It also provides for accurate measurement of basic structures such as lines, rectangles, and circles. Moreover, NANOMETRICS 8300X features a variety of powerful software tools for process control, defect analysis, and reporting. Its process control capabilities include automatic defect classification, automated line width measurements, binning analysis, and more. For detailed defect analysis, 8300X has a suite of defect analysis tools, including particle tracking, feature size analysis, and defect locator tools. Finally, NANOMETRICS 8300X offers comprehensive reporting capabilities that enable users to quickly summarize and visualize the results of their mask & wafer inspection process. Overall, 8300X offers a high level of sensitivity, resolution, and accuracy for inspecting mask and wafer features. With its advanced feature, defect, and process control tools, as well as its comprehensive reporting capabilities, it provides the perfect solution for production performance assessment, process optimization, and rapid design validation.