Used NANOMETRICS AFT 210 #9083845 for sale

NANOMETRICS AFT 210 is an advanced wafer and mask inspection equipment, designed to detect and measure defects during the manufacturing process. The system has a large work area and local controlling computer, making it an ideal choice for semiconductor device fabrication. AFT 210 is equipped with an advanced multipoint tool that can measure up to 8 mask levels at once. Each mask level can be adjusted for different inspection parameters. This gives the unit the ability to detect a wide variety of defects ranging from small contaminants to large surface irregularities. NANOMETRICS AFT 210 also utilizes an at-level optical machine to reduce the amount of false positives. This tool is capable of analyzing images from the mask as well as the sample wafers. In addition, the asset provides real-time data on the status of the inspection process, making it easier for the operator to monitor performance. To maximize the amount of data that can be collected, AFT 210's inspection model includes an automated 3D imaging equipment. This system enables the inspection process to be more accurate and produce better results. Additionally, the 3D imaging unit allows the machine to detect defects in extreme detail, enabling the operator to better identify and measure defects. NANOMETRICS AFT 210 also has an automated defect review tool. This asset allows the operator to quickly look for and review defect images from the mask inspection. The review model is also capable of comparing results from multiple wafers, making it easier to quickly detect any process inconsistencies that may occur. In total, AFT 210 is an extremely accurate and robust wafer and mask inspection equipment. It is capable of performing highly detailed inspection of both masks and wafers, detecting even the smallest of defects. The system is also capable of tracking the inspection process in real-time and performing an automated defect review. Combined, this makes NANOMETRICS AFT 210 an ideal tool for ensuring quality control during any semiconductor fabrication process.