Used NANOMETRICS AFT-3000PHX #9153473 for sale

NANOMETRICS AFT-3000PHX is a fully automated Optical Review microscope and WaferPlane In-die Visualization (WPV) equipment used for automated mask and wafer inspection. This system utilizes advanced optics, robotics, machine vision software, and ultra-high-resolution (UHR) imaging to create a comprehensive and intuitive automated testing process. AFT-3000PHX has a large digital camera for capturing wafer, mask, and surface images simultaneously. A variety of optical lens is available for different magnification and illumination options, offering precise imaging across many imaging modes. It is also equipped with a robotic Wafer Handling Unit for precise sample loading and wafer alignment which ensures repeatable accuracy for all measurements. The machine has a high-class camera which is ideal for capturing high-resolution images of mask features, with an ideal depth of focus which allows for accurate inspection of mask defects. The tool also features a wide field of view and multiple dwell options making it suitable for imaging large fields of view. An Automatic Focus on Fly (AFF) feature allows for optimum detection of defects over the whole wafer, with automated defect detection algorithms running in software. In addition, NANOMETRICS AFT-3000PHX includes a high-tranmission Wafer Plane Visualization (WPV) imaging head which allows for imaging of internal die structures. This head offers long working distance, wide angle imaging and variable zooming for real-time manipulation of the data, with image processing and 3D image processing software being available as an accessory to the asset. Lastly, AFT-3000PHX has an ergonomic design with a user-friendly user interface, providing comprehensive control of all the functions of the model. The Windows 7 or higher operating equipment also ensures compatibility with multiple other applications, enabling optimal workflow and efficient processing of data. NANOMETRICS AFT-3000PHX is the perfect solution for an automated imaging and inspection process.