Used NANOMETRICS AFT 4000 #44869 for sale
URL successfully copied!
Tap to zoom
ID: 44869
Measurement system
Standard Film Types Measured
Single Layer Films: Visible 500-50,000A; UV 25-500A
Double Layer Films: Visible Top Layer 100-30,000A; Bottom Layer 100-10,000A
Single Layer Thick Films: Visible 4-75 microns
Reflectance: Visible 400-850nm
Oxide on Poly: UV 150-10,000A
Oxide on Metal: Visable 3,000-20,000A; UV 500-5,000 A.
NANOMETRICS AFT 4000 is a Mask and Wafer Inspection Equipment designed to provide reliable, accurate and repeatable measurements of the shape and dimension of opaque substrates such as Printed Circuit Boards (PCBs). The system includes a fully automated optical and mechanical scanning stage, an advanced telecentric optical unit, and a wide range of measurement and analysis software tools. AFT 4000 utilizes high-resolution imaging to utilize both light and dark field images, enabling measurement of features as small as 15nm and with 75nm of resolution. The scan stage is equipped with optimized optics, allowing for efficient imaging and repeatable measurements of different feature size and shapes. An optional robotic arm allows both manual and automated sample manipulation. NANOMETRICS AFT 4000 utilizes a variety of advanced techniques, such as scatterometry and fluorescence imaging, to capture a detailed representation of the target material. AFT 4000 also permits measurement of feature edges, sidewalls, step height, profile and flatness. Additionally, the machine can be interfaced with signal processing systems for automated precision measurements. Data analysis software packages integrated within NANOMETRICS AFT 4000 include the ability to generate 3D geometric models, and export the data for CAD or measurement systems. The software also provides customizable reports, with tables and images to clearly display results, as well as the ability to compare data from multiple scans. The overall design of the tool is focused on minimizing errors and producing repeatable results. AFT 4000 is an ideal choice for laboratories, engineers, and scientific researchers as it reliably produces accurate physical measurements and robust data analysis. The asset enables operators to rapidly acquire valuable data points and generate a range of sophisticated images and models over a variety of substrates. With an intuitive user-interface, advanced measurement capabilities and superior accuracy, NANOMETRICS AFT 4000 is an excellent choice for detailed analysis of mask and wafer substrates.
There are no reviews yet