Used NANOMETRICS / BIO-RAD / ACCENT CALIPER Q300 #9298694 for sale

NANOMETRICS / BIO-RAD / ACCENT CALIPER Q300 is a mask and wafer inspection equipment designed for wafer and sub-micron-level inspection tasks. The Q300 features advanced optics technology, as well as software and electronics which create an optimized platform for inspecting semiconductor parts during the manufacturing process. The q300 system employs high-end optical capabilities to inspect various types of wafers and masks, which can range from full chip mask layers and half-mask layers to many other different types and sizes in between. The embedded optics unit includes powerful laser diodes and optical zooms for surface inspection, as well as sub-micron microscopy for inspecting various surface features of the masks and wafers. The machine also offers automated features for full chip analysis and reduced inspection time. Multilayer metrology capabilities are built into the tool as well, offering the ability to measure layer heights and surface roughness on multiple levels with a single measurement. Using advanced tools such as 3D scanning microscopes, the asset can analyze the operation of lithography masks in a variety of true-to-life scenarios. The automated controls of the Q300 enable increased throughput of wafer and mask inspection. High-speed scanning and scanning parameters can be adjusted to user-defined settings, while the control of motorized stages allows for accurate alignment and sampling of inspected parts. Additionally, a user-friendly interface allows for easy programming of the model. ACCENT CALIPER Q300 offers reliable, efficient, and precise inspection capabilities for use during semiconductor and chip manufacturing. Its advanced optics and automation controls help ensure accurate and quality results, while its user-friendly interface simplifies programming and offers enhanced control over the inspection process. Utilizing dedicated and powerful laser diodes and optical zooms, the equipment is capable of inspecting both wafer and mask surfaces, as well as measuring multilayer metrology with a single measurement. With all these features combined, the Q300 is the ideal solution for quality mask and wafer inspection.