Used NANOMETRICS / BIO-RAD / ACCENT CALIPER Q300 #9389798 for sale

NANOMETRICS / BIO-RAD / ACCENT CALIPER Q300
ID: 9389798
Overlay measurement system.
NANOMETRICS / BIO-RAD / ACCENT CALIPER Q300 is a state-of-the-art mask and wafer inspection equipment designed to perform high-resolution measurements of optical defects on wafer substrates. The system is capable of delivering measurements with precision and accuracy levels up to 0.2 microns, making it suitable for sub-micron requirements in advanced semiconductor device manufacturing. The unit features a high-speed, high-resolution camera machine with a resolution of up to 12MP, allowing it to accurately capture images of wafers and capture high-resolution waveform analysis. This tool is also designed with an advanced software to enable the visualization and identification of defects such as those caused by patterning errors, particle contamination, and IC enhancement. The intuitive calibration tools and user-friendly user interface also makes it easy to use and operate. The asset includes a highly sophisticated optical measurement platform with a completely automated full-field-of-view inspection model with a wide-field-of-view scanning optics equipment, which increase throughput for both lab and production environments. This inspection system also offers temperature stable operation with automated environmental and shading calibration. The unit also includes a large, wide-field-of-view imaging platform and a highly efficient imprint/blur correction, which improve accuracy and repeatability. Other features of this machine include an edging module, allowing users to determine the location of the features inside the pattern; a vacuum chuck and removable chuck, which enable measurements of anywhere up to 400 microns; and a magnetic scanning allowed for high-precision measurements on the non-magnetic wafers. In addition, the tool is also integrated with a dedicated software, which provides a wide array of analysis tools and some data management capabilities. It includes manual and automatic defects analysis capabilities for both inspected and in-line images as well as automated allignment and line tracking abilities. It also provides live 3D view and integrated genometry functions for dimensional measurements. ACCENT CALIPER Q300 is ideal for advanced semiconductor device manufacturers in various fields, such as 3D integrated Circuits (3DIC) manufacturing, MEMS, medical device, IoT, etc. With its robust design and variable measuring speed, this asset offers an excellent cost-effective solution for the needs of semiconductor device manufacturers.
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