Used NANOMETRICS / BIO-RAD / ACCENT Q200i #9281248 for sale

NANOMETRICS / BIO-RAD / ACCENT Q200i
ID: 9281248
Wafer Size: 8"
Overlay measurement system, 8".
NANOMETRICS / BIO-RAD / ACCENT Q200i is a state-of-the-art mask & wafer inspection equipment. It is able to detect critical defects on a variety of semiconductor materials, including sapphire, silicon, diamond, and germanium. The system uses advanced optics, including a high-magnification optical microscope, to magnify images up to 200x for extremely detailed inspection of the mask & wafer surfaces. The unit also uses a large, sensitive imaging detector to provide higher sensitivity and faster scan speeds. These advanced components are controlled by an intuitive user interface which facilitates quick and accurate operation. The machine is equipped with powerful software which can analyze the images for critical defects. The tool also offers the ability to store images for further analysis, if needed. Additionally, the asset can be remotely monitored so that users can review images and results from any location. ACCENT Q200i mask & wafer inspection model has been designed for high precision, high yield manufacturing environments. It offers a wide range of capabilities, including multi parameter defect identification and multi substrate inspection. Additionally, the equipment can inspect wafers of different sizes, and can record and review thin-wafer bridging detections. BIO-RAD Q200i is designed to deliver a defect level of up to 25 defects per million (DPM) for patterned masks, and up to 10 DPM for wafers. Its outstanding performance and accuracy help fast-track the production of high-quality semiconductor devices, as well as helping decrease costs and improve yields over traditional methods. In addition to the system's outstanding performance, Q200i also provides a number of features which make it easier to use. It includes an integrated dashboard which provides instant access to image analysis data, an automatic calibration unit, and a powerful and intuitive search engine. It also features a high-resolution camera for improved image analysis accuracy and superior resolution. Overall, NANOMETRICS Q200i mask & wafer inspection machine provides one of the most advanced and advanced solution for semiconductor device manufacturing. The tool offers an efficient and powerful method for detecting and correcting critical defects, resulting in improved yields and a decrease in overall device production costs.
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