Used NANOMETRICS / BIO-RAD / ACCENT Q200i #9389804 for sale
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NANOMETRICS / BIO-RAD / ACCENT Q200i is a powerful mask and wafer inspection equipment that is ideal for the inspection and measuring of integrated circuits (ICs) on semiconductor wafers. The system is designed to detect electrical, optical, and mechanical defects on photomasks, reticles, wafers and other products used in IC manufacturing. ACCENT Q200i is programmed to be a high throughput unit that is capable of providing superb image quality and accurate analysis with no user intervention required, while delivering excellent throughput rates. It features a 5μm CCD (Charge Coupled Device) sensor which has been optimized for high resolution imaging of patterns smaller than 5μm and one million pattern elements. The machine makes use of patented features such as high-resolution stepper imaging, and multiple scan modes, as well as microscopy imaging with focus depth of 650 nm. It also features a high definition image analysis for high resolution detection and hot and cold defect imaging. BIO-RAD Q200i is designed to handle a variety of applications, such as shadow imaging for detecting surface defects, microscopic imaging for detection of structural and particle defects, and image stitching for controlling hard to reach areas. It is suitable for 1X and 2X process nodes and features a fast 50 msec imaging rate, so that high volume production is possible. The tool is equipped with a comprehensive user interface that simplifies the operation of the asset and enables fast integration into customers' production environment. It comes with on-line maintenance and diagnostics quality tools and support, and reporting capabilities, so that users can access help when needed. NANOMETRICS Q200i is an advanced mask and wafer inspection model that offers superior resolution, accurate results, fast throughput, and ease of operation. It is an ideal tool for a variety of semiconductor fabrication processes and meets the demands of those in production, research, or quality assurance fields.
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