Used NANOMETRICS / BIO-RAD / ACCENT Q5 #106305 for sale

NANOMETRICS / BIO-RAD / ACCENT Q5 Mask and Wafer Inspection Equipment is a highly accurate and efficient tool for semiconductor and optoelectronic device manufacturers to inspect their products with confidence. The system is based on a unique scanning confocal optical head and advanced software algorithms, allowing it to inspect a variety of device types and materials, including Photosensitive Optical Detectors, LED wafers, III-V wafers, micro-mirrors and wafer bumpers. The unit provides a high and a low resolution image of each device, with the low resolution image offering a detailed view of the intended contact areas and other nano-scale surface features. It uses four laser channels in Optical Feedback Confocal (OFC) and beam scanning mode enabling extremely accurate and non-destructive 3D imaging. This allows the machine to accurately capture nano-scale features and surface defects, eliminating any doubts about the quality of the device. The tool also features a low light level environment, allowing it to inspect devices while they are still in production, with UV and white light illumination. It has a fast scan rate and can process up to 1,500 wafers per hour and is able to detect defects as small as 3 microns. In addition, ACCENT Q5 Mask and Wafer Inspection Asset includes an intuitive graphical user interface for post-defect analysis and online defect review. This allows you to review, diagnose and identify defects in real-time, ensuring that no defect is lost or overlooked. Furthermore, the model provides advanced analytics and data reporting capabilities, allowing it to detect and report on systematic defects and trends. It also offers various data storage options for continuous archive and access to all quality data, supporting today's regulatory requirements. Overall, BIO-RAD Q5 Mask and Wafer Inspection Equipment provides a reliable, accurate and fast quality inspection solution for manufacturers of semiconductor and optoelectronics devices. Its scanning confocal optical head, advanced software algorithms and low light level environment allow users to inspect devices in an non-destructive fashion, ensuring that no quality issues are missed. Finally, its superior data reporting capabilities allow users to review, diagnose and identify defects in real-time, and store quality data in an archive for permanent access.