Used NANOMETRICS / BIO-RAD / ACCENT Q7 / Q8 #122833 for sale

NANOMETRICS / BIO-RAD / ACCENT Q7 / Q8
ID: 122833
Wafer Size: 8"
Vintage: 1998
Overlay metrology tools, 8" KENSINGTON X,Y,Z Stage Digital tape drive and 3 1/4 floppy drive (2) MITSUBISHI Diamond scan monitors UNIX Operating system Objectives: 4X, 30X, 70X Xenon lamp SECS / GEM Interface Ethernet connection 1998 vintage.
NANOMETRICS / BIO-RAD / ACCENT Q7 / Q8 Mask & Wafer Inspection Equipment is a comprehensive mask and wafer inspection system that combines high-accuracy imaging with sophisticated software-based defect analysis and documentation. Designed to facilitate the rapid and efficient inspection of photomasks used in the semiconductor manufacturing process, ACCENT Q7 / Q8 offers best-in-class performance and reliability. The unit features a digital inspection microscope, which offers superior imaging and lighting capabilities with adjustable magnifications and focus capabilities of up to 2000X. This advanced imaging technology is coupled with an advanced software-defined defect detection machine which can recognize a wide range of IC defects including particle defects, die defects and line defects. With a set of real-time hard processor units and dedicated memory, BIO-RAD Q7 / Q8 offers superior speed and accuracy for both light and electron beam imaging applications. NANOMETRICS Q7 / Q8 provides a range of automated inspection functions including automatic wafer stitching for comprehensive coverage, a comprehensive defect inspection library for accurate defect recognition, and advanced mask visualization and editing tools for highly precise alignment. The tool also supports an industry leading suite of automated defect detection and analysis tools including particle defect categorization, module defect checking, parametric defect analysis and optional advanced flat panel inspection options. Q7 / Q8 integrates seamlessly with ACCENT Aleris Semiconductor Quality Control Asset, allowing for full automation of the defect review process. Aleris Semiconductor provides a fully integrated defect review framework that enables the rapid review, analysis and reporting of critical defects found in the wafers by NANOMETRICS / BIO-RAD / ACCENT Q7 / Q8 model. By integrating into the Aleris platform, ACCENT Q7 / Q8 ensures that all inspected mask and wafer data are readily available for further review. Overall, BIO-RAD Q7 / Q8 Mask & Wafer Inspection Equipment offers superior performance and reliability for mask and wafer inspection in the semiconductor industry. Its advanced imaging and detection capabilities, coupled with easy integration into the Aleris Semiconductor Quality Control System provide added confidence in mask quality and ensure that critical defects are quickly located and reviewed.
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