Used NANOMETRICS / BIO-RAD / ACCENT Q7 #97688 for sale

ID: 97688
Overlay metrology system.
NANOMETRICS / BIO-RAD / ACCENT Q7 mask and wafer inspection equipment is a highly capable, integrated optical system ideal for testing and verifying the quality of nanoscale structured components. It is designed for a broad range of light-based inspection tasks, including defect detection, particle characterization, mask and wafer inspection, and failure analysis. ACCENT Q7 provides a variety of imaging capabilities, including high-speed multiple image viewing and manipulation, three-dimensional mask viewing, and defect detection and analysis. The unit features advanced optical inspection capabilities, such as a large-field-of-view camera with a SCMOS sensor, advanced laser-based imaging, and a fully motorized XYZ stage. This stage allows for the automatic alignment and positioning of wafers and masks, enabling repeatable sample inspection with the highest degree of accuracy. For more advanced mask and wafer inspections, BIO-RAD Q7 features a sophisticated advanced imaging software suite. This software provides a range of so-called "source video" analysis tools, such as advanced defect mapping and measuring capabilities, allowing users to detect potential defects and make corrections before any materials are produced. The machine also comes with an optional particle detector that can detect particulate impurities as small as 150 nanometers. NANOMETRICS Q7 tool is designed with convenience and cost-effectiveness in mind. The asset is user-friendly and can be configured with the available software to meet specific requirements. Additionally, the model's modular design makes it easy to upgrade and expand the equipment as needed. Overall, Q7 is an ideal mask and wafer inspection system. It features an ergonomic design and a high-speed imaging unit that works together to ensure the highest level of accuracy and simplicity. The machine is engineered to produce accurate and reliable results while providing the utmost convenience and cost-effectiveness.
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