Used NANOMETRICS / BIO-RAD / ACCENT Quaestor Q8 #9115816 for sale

ID: 9115816
Wafer inspection systems.
NANOMETRICS / BIO-RAD / ACCENT Quaestor Q8 equipment is an automated mask and wafer inspection system designed to detect and identify wafer defects of varying sizes for improved process quality and control. The unit consists of an autonomous XYZ-stage platform, a custom optics machine, and a large format flat mirror and image sensor. All components are integrated to enable automated scanning and inspection of masks and wafers. The XYZ-stage platform is capable of precise and repeatable motion, allowing ease of use and repeatable setup. It also includes features such as automatic focusing and front side registration that enable accurate positioning of the specimen for inspection. The custom optics tool is designed to provide the highest possible level of image sharpness and sensitivity for defect detection, while still maintaining the required specimen size and field of view parameters. The optomechanical design of the optics asset provides flexibility in terms of focusing parameters, registration accuracy, and field of view size. The large format mirror and image sensor are integrated to enable the scanning and inspection of wafer defects. The mirror is designed to be reflective in nature to ensure maximum amount of reflected light from the specimen surface and maximize defect sensitivity. The image sensor is optimized to provide high resolution images with minimal noise and blur. It also features automatic exposure controls, allowing for enhanced image quality and high accuracy over time. The model is built with a modular design, allowing new features and components to be added over time. This modular design allows for easy integration of new inspection criteria and also ensures that the equipment can remain scaleable. Overall, ACCENT Quaestor Q8 system provides cost-effective and high-performance mask and wafer inspection, with the implementation of advanced technologies and modern design approaches. It is an ideal unit for critical wafer defect monitoring and process quality control.
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