Used NANOMETRICS / BIO-RAD / ACCENT RPM 2000 #9219508 for sale

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ID: 9219508
Vintage: 2007
PL Mapping system A-532nm Laser (Port A): Laser type: JDS UNIPHASE 532 nm DSPP Output wavelength (nm): 532 nm Head and PSU / Controller Spot size on RPM entry slit: 1.3 Output power: Direct from laser: 55.2 mW Sample: 41.8 mw Power stability: <1% Over 2 hours 2007 vintage.
NANOMETRICS / BIO-RAD / ACCENT RPM 2000 is an advanced mask and wafer inspection equipment designed for the semiconductor industry. It offers fast and accurate measurements of both mask and wafer surface pattern features, allowing for improved process capability and product quality. With its high speed, superior optics, and long detection range, ACCENT RPM 2000 is ideal for a broad variety of automated inspection tasks. BIO-RAD RPM 2000 is a 3-axis, non-contact precision imaging and alignment system based on a confocal optical unit. This machine is equipped with a high-resolution CCD camera that is used to acquire images of the wafer and mask surface patterns with a pixel resolution of up to 10 nanometers. While acquiring images, the tool accurately aligns the wafer and mask by capturing a reference pattern in the image. RPM 2000 also has built-in image processing capabilities that enables it to quickly detect subtle defect patterns such as scratches, particles, contaminants, and worn edges. The asset's advanced optics and encoding systems allow it to measure dual wavelength and multi-reflection data for higher-accuracy features measurements. Also, NANOMETRICS RPM 2000 can accurately measure a wide range of micro-features including notching, slits, bridges, and pitches with superior repeatability and accuracy. NANOMETRICS / BIO-RAD / ACCENT RPM 2000's automated operation enables improved efficiency with reduced operator effort to deliver higher quality results with minimized inspection costs. ACCENT RPM 2000 provides a wide variety of output formats for collected data, making it easy to integrate the model into an existing data management environment. The equipment's powerful software package allows users to quickly and efficiently facilitate the entire inspection process from data collection to data processing and analysis. BIO-RAD RPM 2000 is an advanced mask and wafer inspection system that provides accurate, reliable, and fast analysis of micro-features and defects on a variety of substrates and materials. With its easy-to-use interface and automated operation, RPM 2000 is able to quickly and accurately provide data that enable users to achieve significantly higher levels of process capability and quality control.
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