Used NANOMETRICS / BIO-RAD / ACCENT S-100 #77232 for sale

NANOMETRICS / BIO-RAD / ACCENT S-100 is a mask and wafer inspection equipment designed for high-precision inline measurement and analysis. It is capable of performing comprehensive inspection of optical lithography masks and wafers, as well as three-dimensional (3D) retardance mapping. The system utilizes advanced optical technologies to provide superior imaging performance along with reliable and repeatable results. ACCENT S-100 is capable of capturing high resolution images with a sub-micron resolution, enabling it to detect small defects and variations. It also features powerful software tools that can be used to conduct a variety of measurements, such as line widths, topography, and other optical parameters. In addition, the unit can measure boundary regions and feature parameters for a wide variety of materials, including semiconductor, metals, glass and optical coatings. BIO-RAD S-100's modular design allows users to configure the machine to their specific requirements. It consists of four components, including an illumination unit, a wafer scanning stage, a field camera and an image analysis unit. The illumination unit provides light of various angles and intensities to capture images with the highest level of detail and accuracy. The wafer scanner moves the wafer in relation to the field camera, providing the ability to examine completely the surface and complex features. The field camera captures both high-resolution images and low magnification images with or without polarization state. S-100's image analysis capability allows users to compare old and new images to detect changes in the structural features of the wafer and evaluate any resulting differences. It also enables users to quickly and accurately process large numbers of images and collect data that can be used to form detailed reports. In addition to its performance capabilities, NANOMETRICS S-100 is engineered for manufacturability, so it can be integrated in high-volume production lines. It is powered by an advanced algorithm that constantly analyses the collected images, ensuring that high accuracy and repeatability is consistently maintained throughout all stages of the inspection process. NANOMETRICS / BIO-RAD / ACCENT S-100 mask and wafer inspection tool is a powerful tool for high-precision detection, measurement and analysis. It provides reliable and repeatable results, as well as advanced optical technologies for superior imaging performance. Its advanced algorithm ensures accuracy and repeatability throughout all stages of the inspection process, making it an ideal choice for high-volume production lines.