Used NANOMETRICS CTS-102 #9397735 for sale

NANOMETRICS CTS-102 is a mask and wafer inspection equipment designed to measure and characterize the quality of wafers with both manual and automated performance. The system consists of an inspection stage, a PC-based Host PC, and a controller. The inspection stage consists of a high-precision fine focus optical head, a turning control autofocus, and an 8" LCD monitor for observation. In addition to these components, the unit is equipped with an air filter and a pressure regulator for clean air related operations, a temperature controller for the chamber, a temperature calibrator and a backup charger. The Host PC is the heart of CTS-102, providing the machine with the necessary hardware and software components to complete the measurement tasks. It runs on Windows 7 or 8 and is connected to several external devices such as a digital readout unit and an external controller for the optical head. All the components can be easily operated via the GUI of the host PC. The controller is made so as to improve the performance of the tool. It comes with a real-time monitor and control interface, which enables operators to control the entire asset with the push of a button. It also provides feedback on the process parameters, such as those related to the temperature, pressure, and optical head scan. The model allows users to measure a wide variety of parameters, such as thickness and uniformity of the layers, surface defects, as well as contamination levels. The equipment also offers image-capturing capabilities, allowing the operators to generate reports based on the images taken during the inspection process. The images generated during the process are stored in a JPEG format, which allows the user to easily share them with other stakeholders. NANOMETRICS CTS-102 is an important tool for mask and wafer inspection, as it offers a high degree of precision and accuracy for the measurement tasks. It is also user friendly, allowing users to operate it with minimal manual input, as well as providing all necessary functionalities for rapid analysis of the data.