Used NANOMETRICS NanoSpec 210 #142743 for sale

NANOMETRICS NanoSpec 210
ID: 142743
Thickness measurement system Model: 7002-0010 210.
NANOMETRICS NanoSpec 210 is a mask and wafer inspection system designed for the automated and non-destructive review of masks and wafers through various imaging technologies and inspection modalities. NANOMETRICS NANO SPEC 210 provides a comprehensive and repeatable solution for mask and wafer inspection, including particle inspection and defect inspection as well as review of layer-to-layer integration. NanoSpec 210's performance is based on high-quality optics, dynamic image correction, and flexible imaging modes and modalities. All surface defects and particles are illuminated in dark field and a true confocal view of the resist surface is utilized to reduce noise and improve resolution. Image processing is achieved through the combination of a dynamic adjustable window, specialized filters, and multiple contrast and edge enhancement methods, generating crisp and clear images. The system has multiple non-destructive inspection modalities, offering the ability to image and review patterns and defects across a variety of mask and wafer layers. Automated registration algorithms detect and accurately measure particles, while post-pattern defect validation ensures unwanted defects, such as bridging and scratches, are detected accurately and automatically. NANO SPEC 210 also has automated defect classification capability. Defect types, such as shorts, opens, breaks, contact holes, and transitions, are identified and annotated for verification. Using user-defined rules, it can also identify false opens, bridging, and notch defects, ensuring all defects are correctly characterized and accurately traced, recorded, and corrected. NANOMETRICS NanoSpec 210 also offers an array of metrology solutions, such as CD-SEM, line width measurements, and critical dimension variations. Quantitative CD analysis further supports cross wafer anomalies and identification of CD drift and CD uniformity, improving layout and process yield. The compact and intuitive design of NANOMETRICS NANO SPEC 210 enables efficient setup and operation. The user-friendly software interface provides quick, simple navigation, complemented by a range of tutorial guides, pre-configured workflows and batch processing functions. A comprehensive onsite installation and training service is also available, providing customers with complete system support and assistance.
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