Used NANOMETRICS NanoSpec 210 #150266 for sale

NANOMETRICS NanoSpec 210 is a mask and wafer inspection equipment designed to detect defects on masks and wafers used in semiconductor manufacturing processes. The system ensures high image quality and accuracy, minimizing false alarms and maximizing efficiency. NANOMETRICS NANO SPEC 210 is built on two subsystems: The first is a light microscope module, providing a high resolution, full color 22 megapixel CMOS sensor and optical elements. It offers multiple layer capability, allowing quick and easy switching of layer types. The built-in autofocus unit automatically focuses on the sample surface in a matter of seconds, and an integrated autocollimator ensures accurate sample alignment. An advanced optics module allows for both top-down and bottom-up imaging, with an optional manual focus facility available for manual operations. The second is a Wafer Inspection Machine, with the latest in advanced image processing algorithms for high accuracy and throughput. The tool uses a high-end solid state LED illumination source for a wide range of light conditions, and high power optics to ensure a crisp and accurate image. With a fast scan speed of up to 4.2MHz, NanoSpec 210 can quickly and accurately identify and classify defects. NANO SPEC 210 also features a built-in defect classification asset, using digital image processing algorithms to quickly inspect defects down to 0.3 µm size. In addition, a digital marking model is integrated for flagging and labeling identified defects, allowing for improved workflow and traceability. The equipment also includes an intuitive user interface and software package, allowing the user to quickly configure, analyze and troubleshoot wafers and masks. Automatic imaging is enabled through pre-defined parameters, while reports are automatically generated once a batch of wafers has been inspected. Overall, NANOMETRICS NanoSpec 210 is an advanced and accurate mask and wafer inspection system, offering high speed and accuracy, intuitive user interface and automated defect classification unit. It provides users with a dependable and cost effective solution to reduce production time while ensuring high quality products.