Used NANOMETRICS NanoSpec 2100 #9105591 for sale

NANOMETRICS NanoSpec 2100 is a mask & wafer inspection equipment used in the semiconductor industry for quality assurance and semiconductor device defect analysis. The system consists of a powerful laser, optic array, and a scanning stage. The laser is a continuous wave, 532nm green laser source with beam divergence of less than 0.1mrad. The optic array has a numerical aperture of 0.60, allowing 0.1µm resolution. The scanner has an X-Y stage that can accommodate up to 200mm wafers or substrates. The scan speed of the unit is adjustable from 0.5µm to 4m/s. The machine has a dynamic range of 0.2-2000µm, allowing it to inspect microelectronic structures with dimensions as small as 0.2µm. NanoSpec 2100 has a variety of image processing functions which allow it to detect both defect types and sizes. The tool can also identify and flag different defect classes, such as surface contamination, scratches, and particle accumulation. NANOMETRICS NanoSpec 2100 has a user-friendly interface and intuitive controls. It has advanced options such as job editing and a wafer mapping library, making it simpler to generate and analyze pre-defined inspection images. The asset also includes built-in statistical analysis and reporting capabilities, helping users to identify trends in production yields. NanoSpec 2100 is both fast and versatile, allowing users to quickly troubleshoot and optimize production processes. It can perform both on-wafer and mask inspections, enabling users to streamline their fab processes and improve throughput. The model is compliant with industry standards and has robust safety features, providing reliable and uninterrupted performance. Overall, NANOMETRICS NanoSpec 2100 is an advanced mask and wafer inspection equipment with powerful analytical capabilities. It is an ideal choice for quality assurance and defect analysis in semiconductor fabrication processes. NanoSpec 2100 is highly efficient and reliable, helping users to achieve cost savings and improved quality.