Used NANOMETRICS NanoSpec 6100X #9223292 for sale
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ID: 9223292
Wafer Size: 8"
Vintage: 1999
Film thickness measurement system, 8"
1999 vintage.
NANOMETRICS NanoSpec 6100X is a leading mask and semiconductor wafer inspection equipment designed to address the evolving needs of the semiconductor industry. It features a combination of high-performance imaging, image processing, and analysis capabilities, offering ultimate accuracy in wafer and mask evaluation. NanoSpec 6100X enables users to select from a wide range of inspection functions, including quality control, geometry inspections, and light spectroscopy. In quality control, the NanoSpec can detect a variety of subtle defects including all common semiconductor process irregularities. Geometric inspections have been upgraded with new capabilities including shape detection, corner mapping, and line width measurements. NANOMETRICS NanoSpec 6100X has enhanced light spectroscopy capabilities for measuring thin and thick films with high precision. NanoSpec 6100X has a high-resolution, high-speed imaging system. This allows users to accurately detect defects with fast acquisition and imaging times. The high-resolution cameras allow for in-depth analyses of even the smallest features and defects. The unit also features advanced image processing capabilities, enabling users to identify subtle defects and visualize them for detailed inspection. NANOMETRICS NanoSpec 6100X supports a wide range of sample types including photomasks, optical micro-lithography, photoresists, and other industry-standard substrates. The machine is also designed with automated operation and data export capabilities, offering users improved throughput and efficient operation. For optimal performance, NanoSpec 6100X utilizes a selection of specialized accessories. These accessories include optional polarizing, filter wheels, stage and lens motorization, and robotics to automate sample changes. These accessories enable users to customize the tool to their particular needs and to tailor the resulting analysis to the task at hand. Additionally, the software that accompanies the asset provides the user with advanced SEM compatibility, automation features, export capabilities, and post-processing analysis of the data. In summary, NANOMETRICS NanoSpec 6100X is a powerful, versatile mask and wafer inspection model designed to meet the highest standards in the semiconductor industry. Its combination of high-resolution imaging, image processing, and analysis capabilities make it the ideal choice for semiconductor analysis and process inspection.
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