Used NANOMETRICS NanoSpec 8000 #293754442 for sale

NANOMETRICS NanoSpec 8000 is an advanced scanning electron microscope (SEM)-based mask and wafer inspection equipment. The system offers advanced Automated Defect/Partical Analysis (DPA) capabilities and delivers high resolution imaging of even the smallest features and defects on the device. The SEM-based imaging of NanoSpec 8000 operates at an accelerated 5KV column enabling better resolution and faster imaging of the specimen. The unit uses SEM detectors such as CCTV, field emission gun (FEG) and SS BSE to generate detailed images for the user. The automated DPA module incorporated in NANOMETRICS NanoSpec 8000 enables defect and particle analysis from different imaging techniques for a broad range of sample types from photoresist, through silicon oxides and silicides, to polysilicon, and various metals. The machine also features an automated stage, which enables the automatic navigation to the region of interest and precise placement of the specimen. The stage also enables the tool to perform area scans, line scans, pattern scans, multi-site, and multi-layer analysis on a single wafer or mask. NanoSpec 8000 provides quantitative analysis of the sample thanks to its advanced capabilities that include automated labeling, feature data extraction and overlay using electron, optical, or plot overlay tools. It also offers contour analysis, aspect ratio extraction, and critical area images. All these features makes NANOMETRICS NanoSpec 8000 a desirable solution to analyze and inspect device structures in seconds. The asset also offers integrated image parameters-profiles range, contrast and edge, phase analysis, with automated processing to quickly generate results. The integrated touch-screen operator panel and intuitive user interface make NanoSpec 8000 very easy to use and provides optimal control and monitoring of the entire workflow. Overall, NANOMETRICS NanoSpec 8000 is a reliable, high-performance scanning electron microscope-based mask and wafer inspection model that offers advanced Automated Defect/Particle Analysis capabilities for providing detailed images of even the smallest device features and defects. It is an ideal tool for high volume production and material research thanks to its automated capabilities and intuitive user interface.