Used NANOMETRICS NanoSpec 8000X #9228101 for sale

NANOMETRICS NanoSpec 8000X is a professional-grade mask and wafer inspection equipment engineered to provide quick and accurate inspection of wafer substrates and/or masks. It boasts a compact design combined with a robust open architecture to allow for the most advanced inspection capabilities. NanoSpec 8000X is designed to give detailed measurements of physical and optical characteristics of wafer substrates and masks in both research and production environments. An integrated CCD camera is used to capture detailed images of the substrate and mask material, which can be analyzed for critical properties such as defects, etching widths, and overlay accuracy. In addition, NANOMETRICS NanoSpec 8000X can also inspect and measure optical elements in a more precise way. By utilizing a laser source with an integrated interference optics system, NanoSpec 8000X can measure these elements in detail. In addition, it is able to measure reflectance of light as well as other parameters such as surface roughness. Furthermore, it has an Advanced Laser Scanner Unit (ALSS) that allows the user to specialize the scanning parameters for a specific application. NANOMETRICS NanoSpec 8000X is extremely user-friendly and engineered with advanced features such as high throughput capacity, a powerful processor, a simple GUI-based operating machine, and excellent image analysis capabilities. Moreover, its versatile set of features also enables the processing and analysis of files with any format, making it exceptionally Flexible. Furthermore, NanoSpec 8000X utilizes several levels of automation, making it ideal for applications involving high sample throughput. These automation levels include the auto-focus and overlay compensation, as well as automatic wafer assessment and classification. Thanks to its excellent calibration accuracy, the user can be sure that NANOMETRICS NanoSpec 8000X will produce reliable results for a wide range of process-related parameters. In conclusion, NanoSpec 8000X is a superior professional-grade inspection tool designed to provide accurate measurements of wafer substrates and mask materials. It is engineered with advanced features such as high throughput capacity, a powerful processor, a simple GUI-based operating asset, and excellent image analysis capabilities, making it an excellent choice for both research and production environments.