Used NANOMETRICS NANOSPEC 8000XSE #9161012 for sale

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ID: 9161012
Wafer Size: 8"
Vintage: 2008
Thin film measurement system, 8" 2008 vintage.
NANOMETRICS NANOSPEC 8000XSE is a dedicated wafer and mask inspection equipment. It allows for full characterization of wafer and mask layers in terms of defect size, composition, location, and topology. It provides excellent inspection speeds for semiconductor mask and wafer metrology applications. NANOMETRICS NANOSPEC 8000X SE utilizes a custom-built, state-of-the-art 8 inch Metrology/Inspection System (M/I) platform that incorporates the latest optical, imaging, and computational techniques. Its alignment unit provides nanometer-level accuracy for high-resolution measurements. It offers a wide variety of image analysis software, including particle sizing, overlay alignment, and noise reduction. NANOSPEC 8000 XSE features an optical microscope with an 8 inch sensor that allows for fast and accurate measurement of the smallest details. Its software is capable of analyzing any type of defect or pattern on the wafer or mask. Its powerful image processing capabilities allow for quantification of even the most complex fine line patterns. NANOSPEC 8000X SE is also equipped with a powerful scanning electron microscopy machine that provides high resolution imaging for a variety of semiconductor devices. NANOMETRICS NANOSPEC 8000 XSE is ideal for both production and research and development applications. It is versatile and can readily accommodate different sample sizes and configurations. It is compatible with a wide range of wafer and mask technologies and can be adjusted for other regions. It is a highly sensitive tool, offering the highest level of throughput and accuracy for both wafer and mask inspection. The user-friendly interface of NANOSPEC 8000XSE provides easy access to the asset's features. Its intuitive graphical environment allows for precise control and instrumentation configuration. Its multi-level security provides secure access to the model for authorized users. Its fast data acquisition rate and real-time sorting enable rapid inspection and metrology. Furthermore, its intuitive user interface and automated set-up makes the equipment easy to use. NANOMETRICS NANOSPEC 8000XSE is the ideal mask and wafer inspection system for today's production and research environments. With its advanced optical and computing technologies, superior imaging capabilities, and intuitive user interface, this unit offers a reliable and efficient way to ensure high-level wafer and mask quality control.
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