Used NANOMETRICS NanoSpec 8100 #9109938 for sale

NANOMETRICS NanoSpec 8100 is a top-of-the-line mask and wafer inspection equipment. This system is designed for advanced wafer inspection and mapping applications, particularly in the semiconductor, photovoltaic, and advanced packaging industries. NanoSpec 8100 offers an unprecendeted level of performance and data accuracy, delivering extremely precise non-contact inspection and comprehensive defect analysis. NANOMETRICS NanoSpec 8100 utilizes an ultra fast frame rate, with up to 40 images per second and a dynamic range of over 16 bit. This enables very precise non-contact scanning, taking photos of masks and wafers with extremely high definition. It can detect high-density features as small as 10µm in size and can identify both permanent and transient defects in devices such as MEMS, MEMS sensors, and high-end IC's. It can also measure multiple features such as line edge roughness (LER), line width roughness (LWR) and critical dimension (CD) with nanometre accuracy. The unit is equipped with a range of advanced features, including automated scanning, image calibration, and defect analysis. Its 5-axis positioning machine allows for fully automated scanning of both single and multi-die wafers, with real-time image stability feedback for extra accuracy. Advanced image processing algorithms detect even the most difficult defects, and can automatically track them from multiple angles to accurately characterize them. NanoSpec 8100 also includes data post-processing software, enabling users to analyze their data with a range of statistical functions. This can be used to check production trends, optimize scanning settings, and make sure quality standards are met. The tool also includes a powerful image and data archiving asset that allows users to store and retrieve images and data quickly and easily. Overall, NANOMETRICS NanoSpec 8100 is an extremely powerful and precise mask and wafer inspection model. Its ultra-fast scanning, advanced defect detection, and comprehensive data post-processing capabilities make it well-suited for a wide range of advanced die to wafer inspection and mapping applications.