Used NANOMETRICS NanoSpec 9010 #293625764 for sale

ID: 293625764
Vintage: 2011
Film thickness measurement system PN: 1000-50290 XENON Light source LYNX Frame and robot Measurement module PAS Connectivity kit PC: N2000 Operating system: Windows XP 2011 vintage.
NANOMETRICS NanoSpec 9010 is a mask and wafer inspection equipment which consists of a high-precision optical microscope, an image digitalization system, and a suite of sophisticated image processing algorithms for automated defect detection and sizing. It was specifically designed by NANOMETRICS for its superior performance in detecting and measuring extremely small structural defects. NanoSpec 9010 is equipped with a dual-wavelength structured light unit featuring laser diodes, which are used to project precision patterns onto the surface of the wafer or mask. As the patterns interact with the surface irregularities, they are detected and processed with precise 3D metrology, enabling extremely precise and accurate defect measurements. This allows the machine to measure features as small as a few nanometers in width and length. Additionally, NANOMETRICS NanoSpec 9010 features a high-resolution digital camera that enables the imaging of up to 25 samples simultaneously. The tool's compact design and flexibly configurable optics asset make it well-suited for a variety of applications, from photoresist inspection to device failure analysis. It is also capable of detecting and measuring a wide range of defect types, from scratches and pits to breakages and voids. In addition, NanoSpec 9010 includes high-speed image processing algorithms for automated defect detection and sizing, making it extremely convenient for use in production lines. NANOMETRICS NanoSpec 9010 is a powerful and reliable tool for inspecting wafers and masks for very small defects, enabling manufacturers to quickly and accurately identify and diagnose problems in production. Its compact and easy-to-configure design makes it a great choice for a variety of applications, while its powerful imaging and analysis capabilities make it an invaluable tool for quality control.
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