Used NANOMETRICS NanoSpec AFT 180 #19931 for sale

NANOMETRICS NanoSpec AFT 180
ID: 19931
Wafer Size: 4", 5"
Thin film measurement system Microspectro photometer head Wavelength range: 480-790 nm Measures from 400A to 40,000A.
NANOMETRICS NanoSpec AFT 180 is a mask and wafer inspection equipment that offers advanced aerial imaging and automated defect review capabilities. The system utilizes bright and dark field imaging, as well as automated defect classification, to quickly detect and report wafer defects as small as 90nm in size. NanoSpec AFT 180 also provides full automation and traceability of the inspection process, allowing for easy and efficient quality assurance. The imaging capabilities of NANOMETRICS NanoSpec AFT 180 are based on a patented scanning technique that allows for fast inspection. The sensor sweeps the wafer in horizontal and vertical directions, collecting multiple images of each area of the wafer at a high speed. This process helps to reduce the overall inspection time, while still providing high-quality imaging and accurate defect identification. The unit is equipped with two separate optical sensors which are used to detect airborne contaminants. Using both infrared and visible light sensors, NanoSpec AFT 180 is able to detect any particles which may be on the surface of the wafer, such as dust, dirt, or other defects. This ensures that any potential sources of contamination are identified and reported quickly and accurately. In addition to its imaging capabilities, NANOMETRICS NanoSpec AFT 180 also provides automated defect review. This function allows for defects to be automatically classified and assigned a severity level in order to ensure that further examination is only based issued that may actually present a risk to yield or performance. The machine is also equipped with an advanced software package which allows operators to review and analyze the results of the inspection process quickly and easily. Overall, NanoSpec AFT 180 is a powerful wafer inspection tool which offers reliable imaging, automated defect review, and full traceability of the inspection process. This asset enables manufacturers to quickly and accurately detect wafer defects and airborne contaminants, while making sure that efficient quality assurance is maintained.
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