Used NANOMETRICS NanoSpec AFT 180 #9390472 for sale

NANOMETRICS NanoSpec AFT 180 is an automated, high-performance mask and wafer mechanical inspection equipment designed to accurately identify and locate micro-defects and defects on flat wafers and masks. The system ensures that all parts meet production requirements and helps manufacturers to progressively improve their manufacturing processes. Equipped with three digital panchromatic cameras and a motorized wafer stage, the AFT 180 is capable of capturing panoramic images of the sample under inspection at any angle and movement speed, ensuring a wide coverage of the part. Its unique imaging engine utilises an advanced set of algorithms to locate, identify, and classify defects from nanometre to micron-level accuracy on each sample. Additionally, the AFT 180's automated autofocus capabilities make it easier to scan and inspect wafers in larger batches and at high speeds, reducing inspection time considerably. Additionally, its automated defect classification feature allows for quick sorting of different kinds of defects, making it easier for inspectors to identify and isolate issues. Using the AFT 180 is simple and straightforward. The unit requires minimal user intervention, and its large touchscreen LCD ensures easy data entry and viewing of real-time images. The Nanospec's Optimized Defect Map interface allows users to quickly identify and categorise defects on the wafers and masks. Its advanced software supports both manual and automated defect classification, helping users to quickly isolate and classify the defects. Additionally, its analytics capabilities can be used to track trends over time to identify potential issues before they become problematic. Overall, NanoSpec AFT 180 is an industry-leading wafer and mask inspection machine designed for high accuracy and reliable results. Its automated features allow for quick and efficient scanning and image analysis, helping manufacturers to identify defects quickly and accurately and optimize their production processes.