Used NANOMETRICS NanoSpec AFT 181 #9123192 for sale

NANOMETRICS NanoSpec AFT 181 is a next generation mask and wafer inspection equipment designed to provide the highest levels of performance and accuracy. It offers comprehensive wafer inspections at resolutions down to the nanometer range, enabling manufacturers to address the most demanding yield requirements. The AFT 181 is a fully digital system that can inspect a variety of device geometries, from traditional optical targets to the latest advanced addressing schemes. It provides high-precision imaging and precise quantification of surface features such as line widths, edge placement accuracy, and topography. Additionally, the inspection unit is capable of detecting and classifying solder bumps, bumps on high aspect ratios, and other difficult-to-inspect targets. The AFT 181 features an innovative design to optimize inspection performance. It utilizes an advanced imaging machine, which includes a high numerical aperture lens, automated stage, and high-resolution camera. This combination allows for quick and accurate imaging of the targeted areas and features. The tool also integrates proprietary algorithms for image processing to ensure maximum accuracy and reliability. The AFT 181's intuitive operation asset streamlines user workflows. It features a touch-based interface to provide fast access to various functions. Operators are able to quickly set up parameters and customize their set-up for the ultimate in convenience. Additionally, the user interface is customizable to fit user preferences and is able to store up to twelve presets for increased efficiency. The AFT 181 offers an impressive array of features and capabilities, including advanced defect classification for wafers, auto-focus, and an integrated defect image database. These features, along with the model's flexible operation, make it ideal for a wide range of manufacturers. From automotive to R&D applications, this versatile instrument is capable of addressing a variety of quality control needs. Its superior imaging abilities and intuitive control systems make the AFT 181 a powerful and reliable choice for wafer inspection and defect detection. With its advanced design and features, manufacturers can be assured of the highest levels of inspection performance.