Used NANOMETRICS NanoSpec AFT 212 #9208402 for sale

NANOMETRICS NanoSpec AFT 212 is a state-of-the-art automated mask and wafer inspection equipment specifically designed for semiconductor manufacturing, featuring the most advanced inspection technology available on the market. This system combines multiple advanced inspection technologies, such as Automatic Focus Technology (AFT), NanoSpec vector mapping, and an adjustable illumination unit to provide unparalleled accuracy and image quality with respect to defects and other anomalies on the microelectronic wafers. The Automatic Focus Technology (AFT) consists of a pair of stereo cameras which focus the nano-scale features of the wafer based on a high-resolution 3D reflection height map. With AFT, users are able to accurately measure and analyze the surface topography of the wafers with sub-nanometer accuracy. By contrast, traditional high-resolution microscopes can only measure surface features with a resolution of about 5 nanometers. The NanoSpec vector mapping machine allows for the detection of nano scale defects and other anomalies on NanoSpec AFT 212. With this tool a user can measure features down at the nano-scale level, within 10% of the 5nm accuracy achievable by traditional microscopes. These features range from indentations, bumps, and scratches, to bridging, voids, shorts, and more. The adjustable illumination asset of NANOMETRICS NanoSpec AFT 212 allows users to precisely measure the characteristics of the wafer by controlling the amount of light, angle, and intensity placed on the wafer surface. This allows for greater accuracy when scanning the smaller, nano scale features present on the mask and wafer. With this adjustable illumination model, NANOMETRICS is able to provide the highest quality images for defect detection and analysis. In addition, the equipment offers an easy-to-use user interface, allowing users to control various settings, such as focus, exposure time, image size, and magnification. It also features an integrated data analysis system, which allows users to store, analyze, compare, and review data acquired with the unit. By providing high accuracy and reliability, NanoSpec AFT 212 is the ideal solution for mask and wafer inspection on the microelectronic production line.