Used NANOMETRICS NanoSpec AFT 4000 #9167097 for sale

NANOMETRICS NanoSpec AFT 4000 is a state-of-the-art mask and wafer inspection equipment designed to provide quick and accurate results. The system is capable of inspecting a wide range of features, from critical dimensions (CD) to overlay accuracy. It features high resolution digital imaging and 10x objective magnification, allowing for the detailed analysis of nanoscale patterns and features. The unit has a flat panel display with a unique AccuViewTM image enhancement machine to provide improved 2D imaging. It has an automated fiducial and feature recognition tool and the ability to zoom, allowing for precise visualization of defects. The asset has an advanced metrology package complete with defect recognition software, automatic measurements and reporting. The model also has an automated inspection mode where the operator can input corresponding wafer geometries and the equipment then automatically inspects the wafer for defects according to predefined parameters. NANOMETRICS NANOSPEC / AFT 4000 is equipped with motion control for precise wafer positioning and XY stages for wafer centering to ensure the accuracy of the data. It is easy to use and can be navigated via intuitive menus. Furthermore, it offers an Autofocus capability for precise vertical and azimuthal alignment of the wafer. The system is modular, so additional components can be easily added to enhance its functionality. This includes a rotatable wafer stage for 180 degree wafer rotations. The unit is built to be low-maintenance and provides real-time wafer data. It utilizes a data acquisition machine and includes a host computer for data storage and analysis, complete with an event logger to track history during the inspection process. It is also equipped with SAFETYLOCKOUTTM safety features and is fully CE and ISO Certified. NanoSpec AFT 4000 is a powerful and sophisticated mask and wafer inspection tool that provides reliable and valuable analytical data for a variety of wafer geometries and features. It is the ideal choice for semiconductor professionals who need quick and accurate metrology results.