Used NANOMETRICS NanoSpec AFT 4000 #9280325 for sale

NANOMETRICS NanoSpec AFT 4000 is a state-of-the-art mask and wafer inspection equipment developed to provide fast, accurate inspection of patterned device structures on silicon wafers. The system provides superior defect sensitivity and fast die-to-die comparison, so customers can quickly analyze and compare part die characteristics. NANOMETRICS NANOSPEC / AFT 4000 is equipped with patented multi-mode scanning technology to detect defects of all types. The laser-based unit uses digital holography to detect micron-level defects that are invisible to the naked eye. Its high-resolution camera captures high-quality images of patterns and structures on the wafer surface, which are then used to detect a wide range of defects such as residues, scratches, corrosion, voids, and bridge defects. The NanoSpec's advanced control machine is designed to provide detailed feedback on the image capture process. It can also be used to automatically adjust sensitivity, device orientation, excitation levels, and scan speeds, as well as to monitor output and report the results as an electronic file. To optimize performance, the NanoSpec has several powerful adjustment features that let customers selectively adjust the tool to match their specific requirements. These features include an adjustable aperture, which enables high-quality imaging of small features; dynamic capacitance control, which allows for dynamic adjustment of charge levels; and fine tuning of excitation levels, which helps to optimize results for specific applications. The NanoSpec also offers an automated calibration asset, which quickly and accurately sets the image capture parameters. This model also lets customers set up repeatable test scenarios, so each test setup is consistent from run to run. The NanoSpec also provides a full suite of data management features, which gives customers the ability to store, view, and analyze test results. It also connects to an online database, so that customers can easily share test results and collaborate with peers. NanoSpec AFT 4000 is the ideal tool for fast, accurate resolution of mask and wafer inspection challenges. Its combination of advanced features, functions, and performance makes it an invaluable tool for the durability testing of semiconductors.