Used NANOMETRICS NanoSpec AFT #293615480 for sale

NANOMETRICS NanoSpec AFT (Advanced Feature Technology) by NANOMETRICS is a leading edge mask and wafer inspection equipment used for advanced feature and specialty semiconductor inspection. This system offers a higher level of precision and accuracy with a wide field of view for 2D and 3D imaging with intelligent defect organization. NANOMETRICS NANOSPEC/AFT has a unique Smart Feature Scan (SFS) feature which allows for analysis of both clear and opaque features with improved image sharpness and no image shifting. The unit also contains a low background optical platen to reduce background noise and false alarms. The optical design of NanoSpec AFT provides flexibility for customers to adjust inspection parameters, such as light and dark levels, contrast thresholds, and the speed of focus adjustment. The machine also offers several Die-to-Die (D2D) modes that allow users to perform critical defect detection, classification and metrology on each and every die across the entire wafer. The tool is easy to integrate into existing production lines and provides full automation support to ensure maximum screening efficiency. It is also capable of identifying complex defects that are large enough to be detected with non-conductive feature contrast. NANOSPEC/AFT is designed to analyze wafer defects that are difficult to detect using optical and scanning electron microscopes, such as mosaicking and sawing defects, small pits and scratches. The asset has high resolution and repeatability, making it very effective in detecting micro-features and defects that are typically difficult to locate. Additionally, it includes an in-built microscope for easy viewing and inspection of die-level defects. The flexibility and efficiency of NANOMETRICS NanoSpec AFT enable its users to obtain reliable inspection results with consistent quality. Its innovative design also allows for maximum process uptime, maximizing inspection throughput and thus production efficiency. This model is ideal for advanced feature and specialty semiconductor inspections with minimal cost and hassle.