Used NANOMETRICS Orion #9217790 for sale

NANOMETRICS Orion is a groundbreaking mask and wafer inspection equipment that allows users to measure surface topography and geometrical parameters of a wide range of semiconductor devices. It is the ideal choice for manufacturers that need to inspect wafers and masks with an extremely high level of accuracy. At the heart of the system is its proprietary scanning and sampling technology that uses high-resolution Cameras and Modulated Light Sources ​to analyze sample features. A full-frame imaging sensor captures images from multiple views of the sample with high contrast. The unit uses proprietary algorithms to capture and analyze the images, providing high-resolution characterization of the sample's surface topography and physical features in a short amount of time. Orion also incorporates an advanced multichannel signal conditioning module that allows the machine to measure four surface parameters simultaneously. The module measures the angular flatness of surface spikes, protruding portions of surface, thickness variations or distance between tips of surface structures. It also measures the maximum protrusion height of the surface structure and signal cross-sections of the sample in multiple directions. The tool is equipped with an intuitive graphical user interface that allows operators to quickly set up tests, select measurement parameters, measure sample features, and visualize results in real-time. The software also offers powerful calibration tools and a variety of tooling configurations. All measurements obtained with NANOMETRICS Orion mask and wafer inspection asset come with a high level of accuracy and repeatability. The model is designed to meet the most stringent and demanding requirements for industrial and laboratory applications. It offers complete solution for mask and wafer surface characterization, including topography, SPI, SEM, AFM, SEM-EDX, or OWLS applications.