Used NANOMETRICS SDP-2000T #9354596 for sale

ID: 9354596
Film thickness measurement system Model number: 010-0511.
NANOMETRICS SDP-2000T is a Mask and Wafer Inspection Equipment designed to evaluate the integrity and accuracy of semiconductor masks and wafer geometries. The system can provide automated measurement of both 2D and 3D features, using optical images and data acquisition technology. Its length and angular measurements can be performed with high repeatability, offering production line reliability. The unit is composed of two main modules; the Mask Inspection Inspection Module, and the Wafer Inspection Module. The Mask Inspection Module includes an auto-alignment feature, enabling fast and accurate measurements of multiple masks. Additionally, it provides wafer to mask alignment and overlay measurements with interpolations up to 40x magnification and optical inspection for isolated defects. The Wafer Inspection Module is capable of performing inspections of both flat and stepped wafers. The machine can use a 2D surface mapping technique, acquiring between 40 and 200 data points per square millimeter, depending on set parameters. Measurement points can be defined in user-defined zones, for easy retrieval. The inspection results can be automatically saved into the tool, further processed as an internal database, or exported to an external database. The asset also includes advanced image processing and filtering functions, enabling enhanced quality control and further analysis of measured patterns. Additionally, the model provides various display modes, such as stereo or single-view projection, and 3D stereoscopic display. The corresponding software is also highly flexible, allowing for user-defined settings and enabling users to easily customize the operation. Overall, SDP-2000T offers highly reliable and accurate performance, in both mask inspection and wafer inspection. Its flexibility allows it to easily integrate into existing production lines, and its advanced imaging capabilities can provide accurate information about the shape and composition of semiconductor pieces. The equipment can thus prove highly useful for quality control applications, ensuring accurate measurements on a variety of materials.
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