Used NAPSON NC-1200WH #9085606 for sale

NAPSON NC-1200WH is a powerful and efficient mask and wafer inspection equipment that utilizes advanced optical inspection technology to detect defects in both printed circuits and photomasks. It is designed to deliver high-accuracy defect detection and defect-mapping across a wide range of applications, including test-site inspection, small-scale inspection, product assembly, manufacturing and in-line inspection. NC-1200WH features a high-resolution 12 megapixel CMOS sensor with an expansive image area of 12 inches by 9.6 inches, allowing for detailed and accurate inspection of either single or multiple masks or wafers. With an adjustable zoom range of 10x and an adjustable focus range of 10mm, the system provides flexibility to the operator for the purpose of fine-tuning and customizing every inspection. The image area is further enhanced with an LED light source that is individually adjustable, providing control over both brightness and contrast. The unit is also equipped with a dynamic measurement machine that enables accurate and efficient analysis and measurement of numerous parameters, including die size, die shape, die location, die coverage, and other critical profile measurements. Through the use of a built-in PDF or Gerber viewer, NAPSON NC-1200WH can effortlessly process up to 10,000 parts per hour across a wide range of materials and formats, to detect traceability logins, misregistrations, and common printing errors. In contrast to its competitors, NC-1200WH also features an automatic self-learning algorithm that enables it to automatically adjust the sensitivity and accuracy of each input image to deliver improved defect detection and defect-mapping results. With this advanced AI-guided technology, the tool is able to deliver consistent and reliable results, and its wide range of automation capabilities ensures rapid and efficient high-volume defect detection. In addition to providing improved accuracy and speed, NAPSON NC-1200WH also features a user-friendly interface to make its functionality accessible even to operators who are unfamiliar with optical inspection technology. The asset's built-in color-correction allows for fast, intuitive adjustment of color and lighting settings to enable further customization of mask and wafer inspections. In conclusion, NC-1200WH is a powerful and efficient model that offers high accuracy defect detection and defect-mapping across a range of materials and formats, alongside automation capabilities and a user-friendly interface. The equipment's advanced optical inspection technology ensures that it is capable of consistently delivering high-quality results and is an ideal choice for any mask or wafer inspection application.