Used NAPSON NC-80M #9165236 for sale

NAPSON NC-80M is an automated mask and wafer inspection equipment. The system allows for fully automated computer aided inspection (CAI) of both polished and etched masks and wafers. It features a high-resolution TV camera with up to 25 MHz of horizontal resolution to reveal fine detail and texture on masks and wafers. The unit can handle both double- and multi-layer masks and wafers. NC-80M is designed with both a scanning and line scan modes of operation. The scanning mode is used for general inspection where high resolution and ease of operation is required. It offers an extensive library of fault detection algorithms, including repeatability error detection. The line scan mode is used for detailed defect detection by scanning individual strips of the mask or wafer. NAPSON NC-80M offers a host of adjustable parameters, enabling it to precisely match the type of defect being inspected. These parameters include illumination direction, x- and y-speed, x- and y-resolution, sensitivity threshold, scan window size, sampling distance, and fault detection sensitivity. The machine can be configured to detect any combination of open, short, bridge, and hole type defects, depending on the application. The tool has a flexible user interface designed to support a variety of different operating formats. The asset can output to many different formats, such as GIF, TIFF, and PCX, so images can be easily shared with other systems. The model can also output data in a variety of text formats for further processing. NC-80M is a powerful and reliable equipment for inspection of both masks and wafers. It is designed to provide reliable, high-resolution images for detailed defect detection. The system offers flexible setup, automated operation, and a variety of output formats for easy sharing of results. NAPSON NC-80M is an invaluable tool for automated mask and wafer inspection.