Used NAPSON RG-7C / RT-70V #9059502 for sale

NAPSON RG-7C / RT-70V mask and wafer inspection equipment is a fully automated, high performance system designed for use in semiconductor production. It is especially designed for the production of flip chip and package substrates. The unit features a microscope, CCD precision cameras, and a high capacity image analysis module for precise data acquisition and defect detection. It also has a sample holder and holder pockets for mounting and inspection of wafers. The maximum resolution of the machine is 2 μm, and it has a detection area of up to 320 x 320mm. It is fully capable of providing both 1-dimensional and 2-dimensional inspection of both wafers and masks. The tool's detection capability extends from feature sizes in the nanometer range up to 70μm in the visible and sub-visible range. RG-7C / RT-70V's automated asset is easy to set up and operate, making it an ideal solution for any production environment. It features separate probe stages to quickly switch between different pieces, with no need of assistance from the user. The model also features a 3-axis sample stage which allows for precise alignment of the sample when taking measurements. NAPSON RG-7C / RT-70V has an integrated defect report module which allows the user to identify the defect cause, type, inventory level and to monitor relative defect rate of individual defects. It features a comprehensive database for all detected defects. All images are stored in the equipment memory, allowing for easier retrieval and archiving. The operating software also features an AI-based automatic report generation, enabling the user to quickly review large amounts of data. RG-7C / RT-70V is the ideal choice for any production environment requiring precise defect detection, rapid setup and efficient operation. It is extremely reliable and offers excellent value for money.