Used NEGEVTECH NT 3100 #9354788 for sale

NEGEVTECH NT 3100
ID: 9354788
Wafer Size: 12"
Vintage: 2006
Bright field inspection system, 12" 2006 vintage.
NEGEVTECH NT 3100 is a dedicated mask and wafer inspection equipment designed to provide pinpoint accuracy and quality assurance for the fabrication process of semiconductor devices. NT 3100 features a high-resolution, enlarged optical imaging system and built-in proprietary algorithms to optimize defect detection and reduce false-positive detections. A powerful analysis engine with real-time image analysis, feature extraction, and defect classification to detect defects of any type on even the most complex mask patterns. NEGEVTECH NT 3100 is a two-stage unit that provides both top-level detection and detailed analysis of defects. The first stage utilizes laser scanning and diffraction elements to detect defects and analyze feature edges, particle deposition, and other key features. The second stage employs specialized algorithms to classify defect components and calculate an "Estimated Defectivity" measure that represents the potential of a defect to cause chip defects. The machine's real-time defect analysis enables the mask and wafer inspector to take immediate corrective action and eliminate false alarms, ensuring maximum product quality. NT 3100 is compatible with all standard mask and wafer patterning techniques, as well as specialty processes such as extreme ultraviolet (EUV) lithography and nano-imprint lithography (NIL). The tool is compact and can easily be integrated into existing production environments. It is also capable of integrating with other inspection systems, such as non-contact optical inspection systems and automated defect tracking systems. NEGEVTECH NT 3100 is designed for reliability, offering a "Lifetime Quality Assurance" guarantee and rigorous preventative maintenance to minimize asset downtime. The model's upgradable software ensures that it will remain up-to-date with the latest technology and techniques. It also offers a wide range of reporting options, including detailed statistical reports, which enable users to monitor and analyze the effects of different manufacturing methods or process changes. Overall, NT 3100 is an advanced, feature-rich inspection equipment with a robust design and powerful analysis capabilities. It is an ideal choice for ensuring quality and efficiency in the production of sophisticated semiconductor devices.
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