Used NIDEC TOSOK TWi-5000 #9280887 for sale

NIDEC TOSOK TWi-5000 is a mask & wafer inspection equipment designed to check for defects and imperfections in semiconductor wafers and masks. TWi-5000 system is equipped with the latest advances in optical microscopy, infrared and ultraviolet microscopy, automated wafer alignment, sub-micron resolution, automated defect detection and classification, 3D map generation, and professional defect analysis. The unit is composed of a high-precision, high-resolution projection microscope, capable of inspecting wafers and masks with a field of view of up to 50mm. Its special optical design enables it to access defects and imperfections with outstanding sharpness. NIDEC TOSOK TWi-5000 machine is able to detect defects as small as 0.1 microns in size. It can also classify the type and nature of defects, with the ability to automatically identify potential defects using sophisticated image analysis algorithms. It is also equipped with automated wafer alignment capabilities, enabling it to rapidly scan wafer surfaces to obtain high-resolution images. This allows for faster inspection and defect analysis. TWi-5000 also features 3D map generation, which creates a digital three-dimensional model of the wafer surface. This is valuable for defect flagging and sorting, as well as comparison with multiple wafers. Finally, NIDEC TOSOK TWi-5000 includes the professional defect analysis (PDA) software suite, designed for defect characterization and verification. This intuitive software suite includes lifetime statistics, comparison of defects with multiple wafers, and it can also generate reports for certification and compliance. In conclusion, TWi-5000 is an advanced mask & wafer inspection tool that offers the latest technology in optical microscopy, automated wafer alignment, sub-micron resolution, automated defect detection and classification, 3D map generation, and professional defect analysis. It is capable of detecting small defects with high accuracy, making it a valuable tool for semiconductor manufacturing and inspection processes.