Used NIDEC TOSOK TWi-5000 #9280891 for sale

NIDEC TOSOK TWi-5000 is a fully automated, high-performance mask and wafer inspection equipment. It is built around an extremely powerful imaging technology, allowing it to detect and analyze even the smallest defects in a matter of seconds. The system's advanced optics, computational power, and intelligent algorithms enable it to detect and classify particles, surface contaminants, contamination of thin-film layers, and defects in mask geometries. TWi-5000 offers two main modules—the Analysis and Review Module, and the Auto-Review Defect Classification Unit. The Analysis module provides an automated, real-time image analysis of the sample that enables the review of each inspection area and provides both statistical indicators and detailed defect lists. The Auto-Review Defect Classification Machine is designed to help users quickly and accurately classify and group complex surface defect patterns. This tool also processes SEM images in the same sharp and fast manner as NIDEC TOSOK TWi-5000's optical inspection asset, and can quickly and accurately determine the geometrical shapes of particle-type defects. TWi-5000 is equipped with a 10MP resolution camera, allowing it to quickly capture high-resolution images of the sample at any desired magnification. Its fast, powerful synchronized 4k imaging module enables it to capture even the smallest defects with super-fast speed and accuracy. The TWi's auto-focus model also ensures that when the material or mask size on the surface changes, the image is always focused correctly. Additionally, it comes with an auto-image capture function, which takes images and captures detailed defect information with absolutely no calibration or manual adjustment. Thanks to its large FOV imaging equipment, advanced defect detection algorithms, and automated defect analysis tools, NIDEC TOSOK TWi-5000 also offers a newly-developed mask inspection system. This unit quickly scans for broken mask patterns, and can even detect extremely-difficult-to-detect mask defects, improving the overall quality of inspection and detection processes. TWi-5000 is designed for maximum operator convenience and maneuverability. The machine's intuitive software interface and user-friendly environment make it easy to operate, set up, and customize. Additionally, it is designed for easy maintenance, with a single tool used to change the conventional light Reflective Compound Microscope and Oscilloscope, making it easy to keep the tool in top shape. NIDEC TOSOK TWi-5000 is a powerful, reliable, and user-friendly mask and wafer inspection asset that provides maximum quality control capabilities. With its advanced imaging technology, fast defect detection algorithms, and auto-focus functions, it allows for detailed defect analysis and inspection processes in no time. TWi-5000 is also designed for easy maintenance and operation, ensuring that it can be used with maximum convenience and accuracy.