Used NIHON DENSAN TWi-5000 #9293547 for sale

NIHON DENSAN TWi-5000 is an advanced mask and wafer inspection equipment designed to provide reliable and accurate optical inspection of patterned wafers, mask and photomask substrates. This system is specifically designed to deliver automatic analysis, detection and correction of defects in products derived from semiconductor fabrication processes. TWi-5000 unit is equipped with a range of advanced optical detection methods and control systems. This machine is built on a high precision motion control stage allowing for automatic scanning to generate up to 144 images per second within a large field of view range, allowing for accurate and quick inspection. NIHON DENSAN TWi-5000 utilizes highly efficient deep learning-based technologies to analyze the pattern of defects in semiconductor devices and photomasks. With these predictions, further analysis of the defect can be made, assigning the pattern a grade. This provides feedback to the user to aid in efficient evaluation, policy decisions, and improvement strategies around product quality. The tool includes a wafer film checkout asset that allows users to check the quality of an entire wafer with a single exposure or a single full-area image. This model is equipped with an automated process for measuring and evaluating characteristics such as defects' size, type, and number, as well as check for data discrepancies. This equipment also requires minimal input from the user through its automated process. TWi-5000 has enhanced defect analysis capabilities, providing users with the ability to quickly identify and analyze defects in microlithography and IC fabrication production. This system is equipped with an advanced statistical analysis software that can detect and analyze various patterns of defects, such as: large pits isolated particles and scratches scratches and printing flaws fill patterns errors and misalignment. The unit also supports an integrated pattern matching analysis, which can be used to compare the mask pattern to the ideal pattern. This provides an efficient way to identify and analyze any type of mismatch or misalignment of the pattern in the device. With its advanced and sophisticated features, NIHON DENSAN TWi-5000 delivers comprehensive mask and wafer inspection processes, resulting in efficient production of semiconductor devices and integrated circuits. This machine's ability to reduce errors and defects leads to increased product quality and savings on cost.