Used NIKON 3 & 3A #54867 for sale

NIKON 3 & 3A
Manufacturer
NIKON
Model
3 & 3A
ID: 54867
Wafer Size: 8"
Optistations, up to 8"-objectives, repair parts, motors and boards.
NIKON 3 & 3A is a powerful mask and wafer inspection equipment designed for mass production of high-end semiconductor devices. It is able to identify defects accurately and quickly, providing fast and reliable inspection results. 3 & 3A is equipped with in-line and off-line inspection capabilities. The off-line mode is used for product development, pre- and post-production, and R&D. The in-line mode is used for full-scale product inspections. NIKON 3 & 3A's advanced wafer phase probe and edge-to-edge inspection capabilities make it the ideal choice for inspecting high-end semiconductor devices. The system consists of a high-resolution imaging platform, giving operators an eagle's-eye view of the device. The camera is equipped with a 4 Megapixel CCD (charge-coupled device) with a resolution of up to 2048×1536 pixels. The alignment sensor is accurate up to +/- 0.02 millimeters, allowing for precise alignment of the device under inspection. The unit is equipped with an integrated defect inspection machine that is capable of detecting even the tiniest defects on the surface of the device. The tool is capable of detecting particles, voids, and other defects in sizes ranging from a few nanometers to several micrometers. In addition to its defect inspection capabilities, 3 & 3A also offers a wide range of functions for semiconductor device inspection. The surface quality inspection module is capable of performing measurements for surface characteristics such as tilt or warp, micro-buckles, or particle concentration on the surface of the device. It also supports advanced metrics such as 3D stress mapping and roughness measurement. NIKON 3 & 3A is user-friendly, with an intuitive and ergonomic graphical user interface. It is also easily expandable, allowing customers to add more modules and incrementally increase the asset's capability. 3 & 3A is an excellent choice for inspecting high-end semiconductor devices. Its accuracy, speed, and user-friendliness make it a reliable and efficient model for detecting even the most minute defects, and its expandability allows customers to upgrade their equipment as they grow.
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