Used NIKON 3A #9272638 for sale

NIKON 3A is an advanced mask and wafer inspection equipment designed for high throughput inspection and defect analysis. This system is equipped with full-shot optics and a high light intensity that allows for high resolution imaging of masks and wafers. The design of 3A takes into account the most challenging process needs and is capable of inspecting a full shot, scanning up to 25nm feature size. NIKON 3A unit consists of a motorized module incorporating a rotation stage for the wafer or mask and a unique 4-quadrant optical machine. The optical tool is engineered to optimize light intensity and contrast, enabling the highest performance in image quality and defect detection. High sensitivity and contrast is achieved with the low ripple photometry that allows the operator to set a detection threshold and automatically adjust for various lot types, making it easy to adjust the inspection experience. In terms of imaging, 3A asset is highly versatile; it can be configured to inspect both reflective and transmissive masks and wafers. There are several imaging modes, including bright field, dark field, simulated bright field, and oblique and off-axis illumination. It is also capable of recognizing and inspecting 1D, 2D, and 3D shaped defects. NIKON 3A model's user-friendly interface allows even novice users to take advantage of advanced feature detection capabilities. The intuitive, user-friendly interface also makes it easy for users to customize the inspection equipment to fit their specific needs. In addition, 3A system integrates automated pattern recognition and identification algorithms to quickly identify and classify the shapes and sizes of defects. Overall, NIKON 3A is a unique inspection unit designed for efficient and very detailed inspection of masks and wafers. With its high light intensity, full-shot imaging, adjustable detection threshold, imaging modes and automated pattern recognition and classification algorithms, 3A is an ideal machine for mask and wafer inspection and analysis.