Used NIKON AMI-3300 #293600872 for sale

NIKON AMI-3300 is a mask & wafer inspection equipment designed for optical microscopy. It provides a versatile and reliable tool for non-destructive imaging of critical high-resolution patterns on semiconductor substrates such as masks, wafers, and reticles. AMI-3300 features a large field of view (FOV) of 120 millimeters in diameter, which enables detection and analysis of numerous small defects in samples with a high degree of accuracy. The system also comes with a high-resolution digital camera and a variable magnification lens. These features enable inspection and analysis of patterns ranging from 10 microns to 6 microns in size. NIKON AMI-3300 is equipped with a variety of imaging and analysis software, including a contact mode, an imaging optimization tool, and a quantitative analysis suite. The contact mode is used to acquire images in the area of interest on the API surface, and the imaging optimization tool is used to adjust the focus and contrast of each image in order to highlight any defects. The quantitative analysis suite provides precise measurements of feature size and area to improve defect detection. AMI-3300 has an intuitive user interface and is designed to be user-friendly. This unit is easy to operate and navigate, and helps to minimize the time required for mask & wafer inspection. Additionally, the machine supports manual or automated operation, and the customizable commands include calibration, imaging, and data export. To ensure consistent images and analysis results, NIKON AMI-3300 can be configured with multiple light sources including a white light source, a UV light source, and an oblique angle light source. This tool features a motorized stage which enables scanning of large area samples quickly and efficiently. Additionally, a stitched image output makes it easy to view the entire sample without needing to move the sample itself. For additional control of the asset and a wide range of capabilities, AMI-3300 can be integrated with third-party software, such as defect mapping, source level inspection and failure analysis. This model also provides on-board computing, as well as data analysis and visualization. In conclusion, NIKON AMI-3300 is a reliable and user-friendly inspection equipment that is ideal for optical microscopy and quality control of multiple fabrication processes. This system features an intuitive user interface, a variable magnification lens, a motorized stage, and multiple light sources to enable the accurate detection of small defects in intricate patterns. Furthermore, the unit can be integrated with third-party software and supports data analysis and visualization to provide detailed insights into the sample's makeup.