Used NIKON NRM-3300 #9315411 for sale

NIKON NRM-3300 is a mask and wafer inspection equipment that provides high-throughput, high-accuracy probing and metrology capabilities to the semiconductor industry. The system offers low-cost, high-performance operation for both wafer and device analysis. NRM-3300 unit offers an integrated inspection and measurement solution that can be used for both wafer and device tasks. The machine's mask inspection capabilities enable users to rapidly check for defects and possible variations in the dies' masks and surfaces. Using a combination of image enhancement, pattern recognition, 3D defect inspection, and auto-alignment, the tool is capable of detecting a range of possible defects including scratches, short circuits, gap fill, and dimension variation. For device analysis, NIKON NRM-3300 includes a number of advanced metrology features. The asset's infrastructure can be used to facilitate the capture and analysis of die-level data for both post-manipulation and post-process inspection. This includes the ability to acquire images of devices with various magnification capabilities and then apply image processing techniques to provide data for right-angle probes and device parameters such as linearity, dynamic range, contrast, and visibility. With a flexible user interface, NRM-3300 offers an extensive range of tools for fast, accurate and reliable inspection. This includes built-in features such as real-time parametric analysis, digital image processing and color video imaging. The model also offers a comprehensive set of measurement and analysis capabilities for die-level dimensional metrology and data visualization. In addition to its powerful inspection capabilities, NIKON NRM-3300 equipment includes a number of advanced technological features. It is designed to use UV imaging to ensure non-visible pattern registration and to quickly detect subtle material variations, as well as to support various failure analysis applications. The system also includes customizable data management tools for loading and storing patterns, parameter sets and images. Overall, NRM-3300 mask and wafer inspection unit is a powerful and reliable metrology and imaging tool. By offering high-speed, defect detection, device analysis and post-process metrology capabilities, the machine provides a comprehensive set of inspection and measurement capabilities for the semiconductor industry. With its comprehensive set of features and flexible user interface, NIKON NRM-3300 offers users the ability to accurately and quickly inspect and measure devices to ensure failed or substandard production is quickly identified and rectified.