Used NIKON NRM2 #9148415 for sale

NIKON NRM2 is a mask and wafer inspection system designed for quick, accurate, and reliable detection of wafer defects. It combines advanced imaging technology with automated optical and lithographic inspection, allowing operators to evaluate wafer geometry, topography, flatness, and other features. NRM2 is equipped with a high-magnification optics that performs over 4,000 pixels per inch resolution. A built-in 3D laser scanning system allows for optimized detection of defects like particles, scratches, pits, and other irregularities. The improved precision combined with advanced image correction capability enables the detection of small grains and other micro-level defects even during routine analysis. NIKON NRM2 is also capable of pattern recognition for assurance of defect-free wafers. It offers a wide range of features, including automated zoom capabilities, improved defect recognition algorithms, including automated metrology analysis and computational lithography measurement tools. Automated defect detection is also supported, as is ultra-high resolution imaging for enhanced detection of the finest defects. Advanced automation features also enhance NRM2's usability and performance. A powerful, yet intuitive, user interface simplifies and expedites operation. Utilizing streamlined workflow management techniques, users are guided through the inspection process with complete control and accuracy. In addition to automated inspection, NIKON NRM2 is equipped with an advanced image manipulation system that can detect, classify, and search defects at a nanometer-level. This high-level functions supports a wide range of application-specific defect detection capabilities, from bottom pattern assessment, to layer-by-layer wafer inspection. NRM2's combination of advanced imaging technologies and automated inspection makes it a powerful and efficient tool for detecting and assessing wafer's based on their physical characteristics.