Used NIKON Optistation 3 #9065307 for sale

ID: 9065307
Vintage: 1991
Wafer inspection system Missing: Some side panels and optics 1991 vintage.
NIKON Optistation 3 is a high-performance mask and wafer inspection system designed for advanced semiconductor manufacturing. It offers the highest level of performance and consistency in detecting defects across the entire area of a mask or wafer. NIKON OPTISTATION-3 is well-suited for inspecting high precision circuits like those found in advanced CPUs and memory chips. Optistation 3 utilizes advanced illumination technology including dark field and half-field illumination, combined with high-definition optics and advanced signal processing techniques to achieve sub-micron resolution. The design is capable of detecting particles down to 0.12 microns, and features a specialized scatter-light detector to enhance detection of surface defects. It also features 8-bit digital highlighting and automatic hue adjustment for improved color reproduction. OPTISTATION-3 offers a high throughput with its 50nm-wide field of view and high-speed stage driving capability, enabling inspectors to quickly scan larger areas with precision and accuracy. Additionally, an intuitive user interface featuring waveform display, and automated defect judgment allows for quick and easy operation of the system. NIKON Optistation 3 also features advanced contaminants detection for optimal surface cleanliness, as well as foreign material analysis with automated debris recognition for inspecting implants, resist, and particles. In addition, the system also features integrated image processing, on-screen measurements, as well as post-inspection data analysis and export to an external PC. NIKON OPTISTATION-3 offers outstanding performance and reliability for semiconductor mask and wafer inspection. Its high performance optics combined with advanced illumination technology and intuitive user interface make it an ideal choice for advanced chipsets. Its high throughput, automated defect judgment and foreign material analysis capabilities also make it a powerful tool for fabrication and inspection of fine precision chips.
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