Used NIKON Optistation 3 #9233004 for sale
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NIKON Optistation 3 is a high performance and cost effective automated optical metrology equipment used for mask and wafer inspection. It provides a great combination of high accuracy, high throughput, and low defect detection. This system is used for inspection and analysis of mask and wafer layouts and critical dimension measurements for advanced semiconductor fabrication processes. NIKON OPTISTATION-3 consists of an integrated unit with a dual-beam microscope, a scanning stage and accessories, and pattern recognition and image processing software to enhance wafer inspection capabilities. The dual-beam microscope is designed with an advanced objective lens and lighting machine, combined with an intuitive, user-friendly software interface. It enables high-precision imaging and inspection to ensure reliable wafer fabrication processes. In addition, a scanning stage and accessories are included to create a precision optical metrology tool. Optistation 3 is optimized and validated through rigorous quality assurance tests and is approved to be used in the semiconductor industry for its metrology and process control requirements. The asset features high-resolution imaging, a wide field of view, and a multi-axis scan stage to capture the most accurate images and measurements of wafers. Its advanced image algorithms allow for error-free defect recognition and detection, while the pattern recognition and image processing software automatically identify and quantify features on wafers. To ensure reliable metrology and data accuracy, OPTISTATION-3 utilizes a variety of sophisticated features, such as precision auto-focus, high-sensitivity imaging, electronically controlled optics, and subpixel shape recognition. The model also includes robust image stitching, allowing multiple images to be seamlessly connected with high accuracy. Operators can also easily use NIKON Optistation 3 for fast efficient production. For example, its additional features provide step-by-step operations and advanced wafer tracking capabilities, enabling efficient product characterization and data analysis. Overall, NIKON OPTISTATION-3 is a state-of-the-art, high-performance equipment for mask and wafer inspection. This system provides a great combination of accuracy, sensitivity, high-throughput, and defect detection capabilities, making it an excellent solution for effective process control and advanced semiconductor fabrication.
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