Used NIKON Optistation 3A #9115822 for sale

NIKON Optistation 3A is a powerful mask and wafer inspection equipment designed to enable manufacturers to identify yield limiting defects in wafers and masks. It is an equipment system that combines a range of technologies, including a high-magnification optical microscope, a state-of-the-art digital imaging unit, a highly precise motion control machine, and an advanced defect detection and identification software program. The microscope tool of NIKON OPTISTATION 3 A utilizes a Longitudinal Zoom Method with a 6:1 zoom ratio, enabling the user to view wafers and masks from submicron to nano resolutions. The microscope optics can be adjusted to provide maximum brightness and application flexibility. The asset also allows for magnification range of 0.3X to 8500X. The optical imaging model uses a high-resolution camera to capture detailed images of the specimen with up to 13 megapixel resolution. The motion control equipment of Optistation 3A consists of a three-axis XYZ motion stage and a stepper motor for precise step-and-repeat operations. It can perform challenging automated operations such as full-field multi-point measurement, patterned inspection, and focus adjustment. This system enables the user to quickly and accurately control the motion of the optics. OPTISTATION 3 A also includes an advanced defect review software program. This program supports both pattern matching and neural network-based defect detection. It also provides detailed information about detected defects such as the type, size, location, and other characteristics. Moreover, it can be used to conduct detailed statistical analysis to ensure process quality. Overall, NIKON Optistation 3A is a highly advanced mask and wafer inspection unit that allows for highly detailed, precise, and fast inspection of samples. It incorporates a range of technologies to ensure high-precision inspection with excellent image quality. Moreover, its advanced defect detection and review software provides fast and reliable defect identification and detailed analysis of quality process performance.