Used NIKON Optistation 3A #9137337 for sale

NIKON Optistation 3A is an advanced mask and wafer inspection equipment. It provides high resolution, non-contact imaging for wafer and mask inspection applications. Utilizing the latest in optical design and technologies, NIKON OPTISTATION 3 A produces clear and detailed images of mask and wafer substrates with high accuracy and a wide dynamic range. Optistation 3A supports automated pre-alignment and substrate alignment functions to ensure accuracy when inspecting mask or wafer substrates. Its high resolution imaging capability allows multiple focus planes to be obtained over a range of depths, making it ideal for capturing a variety of feature sizes. Additionally, the system offers variable scan speed settings to accommodate different types of substrates and sample conditions. OPTISTATION 3 A employs cutting-edge optics and offers a variety of objective lenses designed to capture a wide range of feature sizes. The unit supports a broad range of image acquisition modes, including single-frame scanning, sequential scanning, dual-frame scanning, and stitching. NIKON Optistation 3A makes image analysis easy with automated algorithms for feature detection and measurement. Additionally, it has a user-friendly graphical interface that provides access to comprehensive tools for inspection, image registration, and reporting. NIKON OPTISTATION 3 A includes a powerful software suite, capable of measuring a variety of defects for a variety of substrates. It supports automated defect inspections, including automatic surface defect inspection on both masks and wafers. Additionally, the machine offers flexible defect classification, which allows users to define custom classes of defects and assign specific thresholds for defects within these classes. Optistation 3A features an advanced tool architecture which ensures reliability and stability. It is constructed of high quality materials and components for superior asset performance. OPTISTATION 3 A offers a unique solution for mask and wafer inspection with its powerful imaging, automated feature detection, and comprehensive defect classification capabilities. It is an ideal choice for demanding surface inspection applications.