Used NIKON Optistation 3A #9371744 for sale

ID: 9371744
Wafer Size: 6"
Wafer inspection system, 6".
NIKON Optistation 3A is a high-performance mask and wafer inspection equipment. It is an advanced optical inspection solution that delivers advanced automated inspection capabilities to help manufacturers meet the challenging demands of today's semiconductor production. NIKON OPTISTATION 3 A is equipped with a high-resolution vision system with a true resolution of 5 μm (millionths of a meter), enabling accurate inspection of semiconductor wafers and masks with a minimum feature size of 5 μm. The unit's high 4K resolution also enables accurate inspection of next-generation finFET transistors. The machine is also capable of detecting a wide range of defects, including debris, scratches, and tape residue, with a sensitivity up to 1E-4. This tool utilizes advanced software and algorithms to support inspection and review of patterned targets at a variety of levels. It is capable of automatically inspecting elements from simple 2D lines and circles to complex 3D structures. It can also accurately recognize patterns, such as resist stacking and nanometer features. Furthermore, Optistation 3A is equipped with an intuitive Human Computer Interface that provides an easy way to manage inspection projects and review defects, helping to streamline the inspection process. In addition, OPTISTATION 3 A also provides high-speed processing capabilities to reduce inspection time. This asset is capable of processing thousands of wafers and masks per day at a rate that is several times faster than traditional inspection systems. Furthermore, this model also offers a flexible data management equipment, allowing users to export, store and view inspection results on remote computers. In summary, NIKON Optistation 3A is a high-performance mask and wafer inspection system that leverages advanced optical technology, software and algorithms to give users a powerful, accurate, and efficient way to ensure quality. Its high-resolution vision unit, sensitive defect detection capabilities, and intuitive user interface make it the perfect tool for semiconductor production.
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